Testing and structural analysis of electronic components

 Belmicroanalysis State Center is accredited in the National Accreditation System of the Republic of Belarus and is a core facility center with unique scientific equipment and instruments. Highly qualified specialists, including 1 Doctor of Sciences and 3 Candidates of Sciences, work at the Belmicroanalysis State Center.

The structure of the Belmicroanalysis State Center includes:
- electrophysical measurement group
- technical expertise group
- scanning electron microscopy group
- optical measurement group.

The main research trends:
- analysis of the structure and elemental composition of microelectronics products and materials by mass spectrometry, ellipsometry, IR spectroscopy, X-ray spectral analysis;
- precision electron microscopic measurements;
- obtaining digitized, video images of macro and micro objects, including elements of integrated circuits (ICs) with submicron design rules;
- measurements of volt-ampere and volt-farad characteristics of IC elements in the temperature range from -60 to +150°C;
- extraction of SPICE parameters of the IC element base;
- IC failure analysis.

Head of the core facility center: Alexander N. Petlitsky, Ph. D. in Physics and Mathematics

Address: 12 Korzhenevskogo str., Minsk, 220108
Contacts: tel.: +375 17 343-18-14.
e-mail: office@bms.by

INTEGRAL JSC also offers the manufacture of ICs and semiconductor devices based on the Customer's design (delivery based on the results of functional control), wafer fab services - performing individual technological operations or blocks of operations (metal deposition, film deposition, growing epitaxial layers, thinning of the wafer back side, etc.), manufacturing of source silicon substrates according to the Customer specification, assembly and measurement of devices in plastic and metal-ceramic packages.