CMOS, 0.35 μm, 1 polySi, 2 metals, 200 mm wafer

CMOS, 0.35 μm, 1 polySi, 2 metals, 200 mm wafer

  • Application, features: Digital IC, highly-resistant,<br />Epitaxy =5 V<br /><br /> <br /><br />NMOS: Vtn=0.6 V, Usd >7 V<br /><br />PMOS: Vtр=-0.6 V, Usd >7 V
  • Process Description: Number of photolithographies, pcs.              14

    Design rule, μm                                          0.35

    Substrate:                             725KDB0,015(100)

    Epitaxial layer:                                   15KDB12

    2 retrograde wells

    Interlayer dielectric:

    SACVD SiO2 + PC TEOS, μm              1.05 μm                                  

    Gate SiO2, Å                                             120

    Channel length

    NMOS/PMOS, μm                                     0.6

    N&P LDD- drains

    Titanium silicide

    Metal I                                     Ti/AlCu / Ti /TiN

    PolySi pitch, μm                                        1.0

    Contacts 1 (W-filled), μm                         ø 0.5

    Metal 1 pitch, μm                                    0.95

    Metal 2                                              Ti/AlCu

    Contacts 2 (W-filled), μm                       ø 0.5

    Metal 2 pitch, μm                                      1.2