CMOS, 0.35 μm, 1 polySi, 2 metals, 200 mm wafer
CMOS, 0.35 μm, 1 polySi, 2 metals, 200 mm wafer
- Application, features: Digital IC, highly-resistant,<br />Epitaxy =5 V<br /><br /> <br /><br />NMOS: Vtn=0.6 V, Usd >7 V<br /><br />PMOS: Vtр=-0.6 V, Usd >7 V
- Process Description: Number of photolithographies, pcs. 14
Design rule, μm 0.35
Substrate: 725KDB0,015(100)
Epitaxial layer: 15KDB12
2 retrograde wells
Interlayer dielectric:
SACVD SiO2 + PC TEOS, μm 1.05 μm
Gate SiO2, Å 120
Channel length
NMOS/PMOS, μm 0.6
N&P LDD- drains
Titanium silicide
Metal I Ti/AlCu / Ti /TiN
PolySi pitch, μm 1.0
Contacts 1 (W-filled), μm ø 0.5
Metal 1 pitch, μm 0.95
Metal 2 Ti/AlCu
Contacts 2 (W-filled), μm ø 0.5
Metal 2 pitch, μm 1.2